Home
Products
SEM
SEM In-situ Solutions.
TEM In-situ Solutions.
Stylus Profiler
Nano Displacement Stage
More...
Applications
Scientific Research
2D Material Growth And Characterization
Lithium-ion Batteries And New Energy Sources
Nanomechanical Testing
Semiconductor
Life Sciences
News
Company News
Industry dynamics
About
Contact Us
400-966-2800
ZEPTOOLS
ZEPTOOLS - Analysis of Backscattered Electrons (BSE) and Secondary Electrons (SE) in Scanning Electron Microscopy (SEM).
In this paper, we introduce the generation mechanism, characteristics and practical applications of two important signal electrons in scanning electron microscopy, namely backscattered electrons (BSE) and secondary electrons (SE).
27
2024
/
02
The application of JS series high-precision step profiler in the field of semiconductors
ZEPTOOLS JS series high-precision step profiler is an advanced self-developed domestic step instrument, using advanced scanning probe technology.
26
ZEPTOOLS - The Effect of Charge Effect in Scanning Electron Microscopy (SEM) Observation and Its Elimination
Scanning electron microscopy (SEM) is a powerful observation tool widely used in materials science, biology and other fields. However, the charge effect is a common and unpleasant phenomenon during SEM observation and can negatively affect image quality. In this article, we will introduce the formation principle of the charge effect, its effect on the image, and the effective methods to eliminate the charge effect.
23
ZEPTOOLS Science - Scanning Electron Microscopy (SEM) Image Contrast Formation Principle
The SEM uses an electron beam to perform a circular scanning motion on the surface of the sample, while monitoring the generation of various signal images in real time, and then modulating the image according to the amount of signal generated.
22
ZEPTOOLS:Detailed Analysis of Scanning Electron Microscope Electron Optics System
The electron optics system is the key to achieve high-resolution imaging in scanning electron microscopes (SEM). Its excellent design and optimization determines the instrument performance and image quality
21
From Macro to Micro - The Application of ZEM Series Benchtop Scanning Electron Microscope in Rock Analysis
As one of the main constituent materials of the earth's crust, the microstructure of rock is of great significance for understanding geological processes, resource exploration and engineering construction
20