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Product Classification
● Scanning Electron Microscope
● SEM In-Situ Solutions
● TEM In-Situ Solutions
● Stylus Profiler
● Nano Displacement Stage
● Scanning Tunneling Microscope
● Chemical Vapor Deposition Systems
● Grating Ruler
● Two Dimensional Material Transfer Station
● Ultra High Vacuum Components and Accessories
● Probe Stages and Cryogenic Systems
● Piezo-Electric Objective
● Lithography Machine
in-situ TEM Stretching Measurement System
in-situ TEM 360° Horizontal Rotating Measurement System
in-situ TEM Frozen Measurement System
in-situ TEM Vacuum Transfer Measurement System
in-situ TEM Multi-well Measurement System
in-situ TEM Sample Rod Pre-extraction Storage System
in-situ TEM High Temperature Mechanical Measurement System (Quantitative Force + Electricity + 3D Manipulation + Heating)
in-situ MEMS-TEM-STM Multi-Field Measurement System (Non-Quantitative Force + Electricity + Light + Heating)
in-situ TEM Photoelectric Property Testing System (Non-Quantitative Force + Electricity + Light + Three-Dimensional Manipulation)
in-situ TEM Cryo-electrical Test System (Non-Quantitative Force + Electricity + Cryogenics + 3D Manipulation)
in-situ TEM Mechanical-Electrical Measurement System (Quantitative Force + Electrical + 3D Manipulation)
Semiautomatic Stylus Profiler JS100B