Zeyu Technology's in-situ TEM/SEM solutions have helped nearly 50 university/institute users publish a large number of high-quality research results. In order to further develop the user's research ideas, the public will continue to update some original research results in the future to help users give full play to their PicoFemto.®Function of the sample rod in situ.

Today, Xiao Bian takes you to review a great work published by Xin Zhang and others in Science in 2017 (article title: Direction-specific van der Waals attraction between rutile TiO2 nanocrystals. Zhang et al., Science 356, 434-437 (2017)). We know that the lattice orientation between crystals determines the magnitude of the force between crystals, and the theoretical model behind it has been well established. However, it is still difficult to quantitatively measure the interaction force between them. In this work, Xin Zhang et al. investigated the effects of mutual orientation and surface hydration of rutile titanium dioxide nanocrystals on the van der Waals dispersive attraction. They prepared a titanium dioxide (001) transmission electron microscope sample with a definite orientation of rutile structure, cleverly used AFM cantilever beam combined with ETEM to measure the van der Waals dispersion force between rutile nanocrystals, systematically evaluated the effect of intervening water, and made quantitative comparison with the prediction of Livshitz theory. Using the AFM-STM integrated sample rod, we can study the morphological characteristics, structural changes and mechanical properties of different materials under different loads by means of the resolution advantage of the transmission electron mirror and the various analytical functions of the electron mirror. In addition, with the high-resolution force advantage of AFM, you can also make quantitative in-situ real-time measurements of small-scale forces.

In this issue, the editor uses zinc oxide nanowires to replace the titanium dioxide in the above paper, combined with the PicoFemto of Zeyou Technology.®A series of in-situ force-electric integrated sample rods are used to restore the experimental methods in the above papers.

The experimental results in Figure 1 (Science 356, 434-437 (2017))

Figure 2 The PicoFemto in situ force-electricity integrated sample rod

used in this experiment The following are the test data in this experiment:

1. the morphological characteristics of a single nanowire under different stress conditions

Note: The in-situ video in this experiment can be viewed after paying attention to the public number at the end of the article.

2. used AFM mechanical rod to measure the van der Waals force between zinc oxide nanowires and AFM tip

Note: The in-situ video in this experiment can be viewed after paying attention to the public number at the end of the article.

When the zinc oxide nanowire is moved to the AFM tip with a piezoelectric ceramic device close to the calibrated elastic coefficient, the nanowire will be quickly attracted by the AFM tip. Subsequently, we slowly moved the sample away from the AFM tip while using the software to obtain the force and displacement curves.

3. the morphology and Force-Displacement curve of the same sample under different stresses

Note: The in-situ video in this experiment can be viewed after paying attention to the public number at the end of the article.