Xiaobian just reported the news of product installation and acceptance of Queensland University of Technology in Australia in May. Unexpectedly, the research results were published in Nano Letters in October.

Use PicoFemto®In situ sample rod published research results continue to update, the future small series will continue to update product application cases. Teachers who missed the previous report can also click "previous articles" on the front page of the public number to read. You are also welcome to pay attention to the public number. Here are the cutting-edge information in the field of electron microscopy, special experimental schemes and high-level research results. Come and open your brains with your friends.

Recently, Queensland University of Technology in Australia published the research results entitled "Mechanical, Electrical, and Crystallographic Property Dynamics of Bent and Strained Ge/Si Core-Shell Nanowires As Revealed by in situ Transmission NanoLetters Microscopy" (DOI: 10.1021/ACS. NANOLENT.8B03398) in Electron. The researchers characterized the mechanical, electrical, and crystallographic properties of Ge/Si core-shell structure nanowires in situ in a transmission electron mirror using PicoFemto in-situ mechanical-electrical sample rods from Zelau Technology.

Research shows that under large bending strain, the Si shell irregularly transforms into polycrystalline/amorphous state, while the Ge core continues to maintain a single crystal state on the compressed side. At the same time, the nanowires show periodically changing electronic properties and have good mechanical properties. Combined with the electron diffraction patterns obtained by in-situ TEM and theoretical simulation calculations, the results show that the non-equilibrium phases of polycrystalline/amorphous silicon and β-Sn Ge that appear during the deformation of the nanowires can explain the above-mentioned mechanical properties of the material and the changes in electrical conductivity under strain. Atomic simulations of Ge/Si nanowires show significant changes in their electronic structure during bending and the appearance of a conductive channel in the compressed region, which may also be the reason for the increase in conductivity in the bent nanowires.

PicoFemto in-situ mechanical-electrical sample rod of Zeyou Technology constructs a mechanical-electrical test platform in a transmission electron mirror, stably manipulates the sample and accurately applies/measures quantitative mechanical and electrical signals, showing high performance in load resolution (nN level) and current resolution (nA level). It is worth mentioning that the high-resolution lattice phase was photographed in this study, and this product is also the only in-situ TEM mechanical testing system in the world that can photograph the high-resolution lattice phase.

Figure: Experimental Schematic Diagram

Figure: diffraction pattern and lattice phase

figure: mechanical property characterization

figure: corresponding relationship between electrical property and structural change.

Figure: Theoretical Calculation