Application case of optical-photoelectric measurement system for in-situ transmission electron microscopy

Release time:

2017-12-20

ZnO is an important group II-VI semiconductor material. It possesses an exciton binding energy of up to 60 meV and a thermal activation energy of 25 meV. ZnO nanowires can be used to fabricate waveguide tubes, nanolasers, photodetectors, and light-emitting diodes. In these optical applications, the coupling characteristics between excitons and longitudinal optical phonons (LO) have been the topic of discussion. This coupling characteristic is often related to the lattice structure and stress-induced defects.

Figure 1:(a) In-situ transmission electron microscope optical-photoelectric measurement system application schematic; (B) TEM image of a single ZnO nanowire, the electron beam is focused At the end of the nanowire. (c) Illustration of the luminescence mechanism of ZnO nanowires; (d) Typical CL spectra.

ZnO nanowires are placed on the in-situ TEM optical-photoelectric measurement sample rod, and a 2 mm diameter optical fiber is led to the sample through a nano-manipulation probe that can be manipulated in three dimensions. The nano-manipulation probe can not only help to find the test position, but also can be used to select and manipulate individual nanowires. The monochromator and CCD are connected to the fiber optic interface and used to receive the signal.

Figure 2: Different CL spectra can be obtained by changing the position where the electron beam is focused on the nanowire.

Figure 3: Using nano-manipulation probes to apply different stresses to nanowires, the shift of CL spectral peak positions can be observed.

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