Figure 1:(a) XRD peak comparison of CdS nanoribbons and CdS/ZnO dendritic heterojunctions. (B) CdS/ZnO dendritic heterojunction observed under low magnification SEM. (c) and (d) correspond to the CdS/ZnO dendritic heterojunction observed under SEM and TEM, respectively.

Figure 2:(a) In-situ transmission electron microscope optical-photoelectric measurement system application schematic diagram. (B) In-situ transmission electron microscope optical-photoelectric measurement sample rod head real shot.

The experimental sample is glued to the gold needle and placed on the head of the in-situ sample rod. At the other end of the gold needle is an electro-optical probe that can be manipulated in three dimensions. The photoelectric probe is composed of a tungsten metal scanning probe and a bidirectional optical fiber. By manipulating the photoelectric probe, the probe can be closely attached to the sample and form a loop, and the optical signal can also be transmitted to the specified position of the sample through the optical fiber. After the fiber is externally connected to the 405 nm laser, the 405 nm optical signal can be applied to the sample in the TEM, and the photoelectric response performance can be measured in situ.

Figure 3: Structural characterization of CdS/ZnO dendritic heterojunction under TEM.

Figure 4:(a)(B) TEM images corresponding to CdS nanoribbons and CdS/ZnO heterojunctions, respectively, placed in the in-situ optical-fiber sample rods. (C) and (d) correspond to the switching characteristics of CdS nanobelts and CdS/ZnO heterojunction I-V curves, respectively. (E) and (f) correspond to the response characteristics of CdS nanobelts and CdS/ZnO heterojunctions to periodic optical signals, respectively.