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• Launched the domestically developed multifunctional scanning electron microscope ZEM30 Pro

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2026

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05

• Launched the first domestically developed desktop field emission scanning electron microscope, ZEM Ultra • Launched a domestically developed electron beam lithography system

12

2026

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• Recognized with a full article in a Nature series journal.

12

2026

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Unlocking the Potential of In Situ Measurement in Electronic Measurement Instruments

In situ measurement refers to the process of obtaining data directly from the environment or system being studied, without removing samples for analysis in a laboratory setting. This technique is particularly valuable in the field of electronic measurement instruments, where precision and immediacy are crucial. By utilizing in situ measurement, professionals can gather data in real-time, ensuring

10

2026

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05

Nature Electronics | ZEPTOOLS In-Situ TEM Facilitates Microscopic Mechanism Study of In-Sensor Computing Devices

The rise of intelligent edge applications, such as micro-robots and wearable devices, has imposed stringent requirements for low power consumption in visual perception systems. Although the traditional complementary metal-oxide-semiconductor (CMOS) architecture is technologically mature, the computational and memory overheads associated with analog-to-digital conversion and algorithm execution often exceed the extremely low power budgets of edge devices. In-sensor computing technology integrates optical sensing and analog computation within a single chip, reducing data redundancy and significantly lowering energy consumption from the source, making it a key pathway to address the above bottleneck. Currently, researchers often attempt to use electrostatic doping or two-dimensional materials to encode tunable photoresponsivity weights, thereby performing the matrix-vector multiplication operations at the core of neural networks.

09

2026

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Exploring the Impact of SEM Applications in Optical Instruments and Microscopy

Scanning Electron Microscopy (SEM) applications are transforming the landscape of optical instruments and microscopy, allowing scientists and researchers to explore microscopic structures with unprecedented detail. SEM is a powerful imaging technique that utilizes focused beams of electrons to create high-resolution images of sample surfaces. In the context of optical lenses and microscopes, SEM a

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2026

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