Can Zealway Technology's desktop SEM meet the needs of online quality inspection in factories?


Release time:

2025-08-19

In the wave of manufacturing transformation and upgrading, online quality inspection has become a core component for improving production efficiency and ensuring product quality. Traditional quality inspection equipment is difficult to meet the refined testing needs of modern factories due to its large size, complex operation, and harsh environmental requirements. With its independently developed ZEM series desktop scanning electron microscope (SEM), ZEWO Technology provides an efficient, flexible, and economical solution for online factory quality inspection with the advantages of “desktop-level volume, nanometer-level precision, and full-chain coverage.”

In the wave of manufacturing transformation and upgrading, Online quality inspection has become a core component of improving production efficiency and ensuring product quality. Traditional quality inspection equipment is difficult to meet the refined testing needs of modern factories due to its large size, complex operation, and harsh environmental requirements. With independently developed ZEM series benchtop scanning electron microscope (SEM) with the advantages of "desktop-level volume, nanometer-level precision, and full-chain coverage", it provides an efficient, flexible, and economical solution for online quality inspection in factories.

1. How does desktop SEM break through the bottleneck of traditional quality inspection?

1. Small size, suitable for complex scenarios

The volume of the ZEM series benchtop scanning electron microscope of ZEWO is only 20% of that of traditional equipment, and it can be directly deployed in ordinary laboratories, next to production lines, or even in mobile testing vehicles , without special anti-vibration or magnetic shielding devices. This flexibility enables it to quickly respond to the multi-scenario quality inspection needs of factories, such as:

AI chip detection : Real-time screening of nano-scale defects to ensure the reliability of "Chinese chips";
Material defect analysis : Such as the toxicity research of tire wear particles and latex particles to support environmental and safety testing;

图 TWP 和 LAP 在7天浸出过程前后的扫描电镜图像:(A)浸出前的 TWP,(B)浸出前的 LAP,(C)浸出后的 TWP,(D)浸出后的 LAP

Industrial ceramics, metal components : Quickly detect grain structure and component distribution to optimize production processes.

2. Efficient imaging, accelerating the quality inspection process

ZEM series is equipped with Rapid evacuation technology and One-button automatic operation , can be completed in a single day Hundreds of samples of defect screening . For example:

Metal FDM printed parts : Through the optimization of thermal degreasing process, combined with SEM real-time observation of pore closure process, to improve the strength of 3D printed parts;
Lithium battery separator : Quickly analyze porosity and uniformity to reduce the risk of battery short circuit.

3. Low cost and easy operation

The purchase and maintenance costs of traditional floor-standing SEMs are high, while the ZEM series The price is only 1/3 of similar products , and the operation interface is fully Chinese visual, non-professional personnel Can get started in 30 minutes . For example:

Semiconductor packaging production line : Front-line workers can directly verify the quality of chip packaging through SEM, reducing reliance on external experts;

Pharmaceutical quality inspection department : Low-cost deployment to meet the detection requirements of the Chinese Pharmacopoeia for drug particles and impurities.

2. Practical application: The value of desktop SEM in industrial quality inspection

1. Microscopic quality control of auto parts

A car company used ZEM20 Pro to perform in-situ tensile tests on aluminum alloy wheels, combined with EDS component analysis, to observe the microscopic deformation of the material under stress in real time, and successfully optimized the casting process, increasing the fatigue life of the product by 20%.

图 Ti65合金在室温下的原位拉伸测试:(a-c)分别为0%、1%和5%应变下的扫描电镜图像及滑移迹线分析;(d-f)分别为0%、1%和5%应变下的反极图(IPF)映射

2. Efficient screening of electronic components

An AI hardware manufacturer introduced ZEM electron microscope to perform nanometer-level detection of the gate oxide layer thickness of AI chips, the defect detection rate increased to 99.5%, and the yield rate increased by 15%.

图 芯片各部位部分表征图

3. R&D support for new energy materials

A university team used the ZEM series to analyze the surface morphology of the positive electrode material of sodium-ion batteries, which accelerated the development of new electrode structures.

3. Why choose ZEWO desktop SEM?

Full scene coverage : From laboratory R&D to production line quality inspection, it supports various detection modes such as normal temperature/high temperature, vacuum/atmosphere;
Intelligent adaptation : Compatible with extended functions such as in-situ stretching, heating, and cooling to meet the needs of dynamic process analysis;
Compliance guarantee : Complies with international standards such as the Chinese Pharmacopoeia and ISO, and the test data can be directly used for quality certification;
Localization service : Four major R&D centers (Beijing, Shanghai, Dongguan, Tongling) across the country provide rapid technical support and reduce operation and maintenance costs.

ZEWO desktop SEM with " Nanometer precision, desktop deployment, affordable price " has redefined the boundaries of industrial quality inspection. Whether in the fields of semiconductors, new energy, automobile manufacturing, or biomedicine, its flexible, efficient, and economical characteristics can inject new impetus into factory online quality inspection and help Made in China leap to "Intelligent Manufacturing".

ZEWO ZEM Series Benchtop Scanning Electron Microscope