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Scanning electron microscopy electron beam radiation damage and how to mitigate it

Scanning Electron Microscope (SEM) is a commonly used material characterization technique that scans the surface of a sample with a focused electron beam and uses the signals generated by the interaction of the electrons with the sample to obtain high-resolution topographic images. However, radiation from the electron beam may cause damage to the sample, especially at high beam densities. This radiation damage may alter the surface morphology and chemical composition of the sample, affecting the accuracy of the experimental results.

29

2024

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01

Congratulations! ZEPTOOLS has been officially recognized as one of the first Anhui Provincial Enterprise R&D Centers.

Congratulations! ZEPTOOLS has been officially recognized as one of the first Anhui Provincial Enterprise R&D Centers.

"ZEPTOOLS.Anhui Provincial Enterprise R&D Center" has successfully obtained recognition. This recognition represents an important acknowledgment and affirmation of Zeptools' contributions to technological innovation and industry leadership.

10

2023

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10

Featured on CCTV! ZEPTOOLS' step profiler showcased on CCTV News

Featured on CCTV! ZEPTOOLS' step profiler showcased on CCTV News

CCTV reported on August 24th that during his research trip to Guangdong, Premier Li Qiang visited Songshan Lake Materials National Laboratory and inspected several demonstrations of new technologies and products. Among them, Academician Wang Engo, Chairman of the Board of Songshan Lake Materials Laboratory, provided a detailed introduction to Premier Li Qiang about domestic products such as the step profiler, which have been successfully industrialized and put into mass production by Zeptools, filling a gap in the domestic market.

24

2023

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08

Breaking News! ZEPTOOLS Honored with a Full Report in the Nature Series Journals.

Breaking News! ZEPTOOLS Honored with a Full Report in the Nature Series Journals.

On June 15th, Zeptools was featured in a full report in the Nature series journals titled "Nanotech start-up story: Making versatile electron microscope tools," making it the first scientific instrument company in China to receive this prestigious recognition.

15

2023

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06

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