Schottky Field Emission Scanning Electron Microscope

ZEM Ultra

Schottky Field Emission Electron Source 
The Pinnacle of Scanning Electron Microscope Performance

Better than 2.5nm Resolution | 1,000,000x Magnification

Ultimate Resolution, Pinnacle of Micro-Nano 
Breaking the Performance Boundaries of Equipment

The ZEM Ultra Field Emission SEM is designed for advanced microstructure observation and high-precision material analysis, providing researchers with detailed imaging performance and reliable operation. As a high-resolution scanning electron microscope, it uses advanced field emission technology to achieve clear surface observation and support research in semiconductors, materials science, microelectronics, nanotechnology, and other scientific fields. The system helps users analyze material characteristics and explore microscopic structures with greater accuracy.

Built with precision engineering and careful manufacturing processes, the ZEM Ultra Field Emission SEM focuses on stability, flexibility, and long-term performance. From key component assembly and system integration to calibration and quality testing, each production stage is controlled to ensure dependable operation. With advanced imaging capabilities and user-oriented design, the system provides an effective solution for laboratories and research teams requiring accurate micro-scale analysis and innovative material exploration.

The ZEM Ultra Scanning Electron Microscope adopts an advanced Schottky Field Emission Electron Source, combined with a unique three-stage independent vacuum design. This design ensures a resolution better than 2.5nm, perfectly meeting the characterization needs of most samples' micro-nano structures.

Not just clarity. The ZEM Ultra comes standard with a large beam current and an extra-large sample chamber, laying the foundation for its powerful expandability. It supports integration of in-situ functional sample stages and high-end analytical accessories such as EDS and EBSD, making it an all-around flagship platform for scientific research and industrial inspection.

ZEM Series Scanning Electron Microscopes

Full Series Coverage, Choose Your Preferred ZEPTOOLS SEM

Learn More

Application Cases

Exceptional Imaging Technology Meets All Your Requirements

More Cases

ZEPTOOLS ZEM Series SEM Helps Research Teams Publish High-Level Journal Achievements

Nature Sub-Journal: Fiber-Integrated Graphene Ultrafast Electron SourceZEPTOOLS ZEM Series Desktop SEM served as the demonstration platform, replacing the original tungsten filament gun with a fiber-integrated graphene ultrafast thermionic electron gun, achieving pure pulsed electron imaging (~100 nm resolution) and CdSe/ZnS quantum dot cathodoluminescence/time-domain spectroscopy measurements, verifying that this light source is plug-and-play on conventional electron microscopes and enables time-resolved characterization.

New Strategy for Bladder Cancer ImmunotherapyZEPTOOLS ZEM Series Desktop SEM was used for BCG-MBs morphological characterization. After gold sputter coating of lyophilized microbubbles, multi-magnification observation revealed their regular spherical contours and smooth surfaces, and clearly presented the irregular attachment of BCG bacteria on the shell surface, providing direct microscopic evidence for the successful construction of microbubble structures and drug loading distribution.

Aluminum Alloy/PEEK Friction Lap WeldingZEPTOOLS ZEM Series Desktop SEM was used to characterize the cross-section and fracture surface micromorphology of 5052Al/PEEK friction lap welded joints, clearly presenting the interfacial molten layer, spherical bubbles (approximately 500 μm), and the ridge-like PEEK strong bonding zone adjacent to the bubbles, providing direct microscopic evidence for the regulation of bubbles by heat-pressure ratio U and the establishment of interfacial bonding mechanisms.

Ferroelectric Domain Coupling Mechanism of Polycrystalline PZT CeramicsZEPTOOLS ZEM Series SEM was used to observe the fracture surface morphology of 75/25PZT and Mn/Nb-doped samples before and after quenching, statistically analyzing the average grain size (approximately 1.8–5.1 μm and essentially unchanged after quenching), corroborating that the changes in electrical properties originate from domain structure rather than grain size or grain boundaries.

Powerful Tool for Triple Barrier Structure Morphology CharacterizationZEPTOOLS ZEM Series Desktop SEM was used to observe the micromorphology of cellulose/chitosan coaxial cryogel fibers (CCF): clearly presenting the triple barrier structure of the regenerated cellulose sheath layer (~1 μm pores), the retained air layer between sheath and core (approximately 200 μm), and the chitosan core layer (<500 nm nanopores), providing direct morphological evidence for the thermal insulation mechanism.

Some Customers

The Trusted Choice of Numerous Universities, Research Institutions, and Enterprises

Start Your High-Resolution Observation Journey

Independently Developed by ZEPTOOLS, Providing a Complete Set of Micro-Nano Analysis Solutions

Phone Consultation +86-400-966-2800

Email Consultation micage@zeptools.com