ZEM30 PRO

The High-Resolution Choice for General-Purpose Scanning Electron Microscopes

2.5nm Resolution | 500,000x Magnification

Brighter, Clearer
More Powerful Expandability

The ZEM30 Pro is a high-performance general-purpose scanning electron microscope. It breakthroughly adopts a LaB6 (Lanthanum Hexaboride) filament, providing a higher-brightness electron beam source compared to traditional tungsten filaments, thereby significantly improving image quality and pushing resolution to 2.5nm.

More than just observation. The ZEM30 Pro features a modular column design, with a pneumatic structure ensuring the optical path continuously maintains a high vacuum state. Combined with a 5-axis high-precision sample stage and rich interfaces, it can easily accommodate various in-situ stages for tensile, heating, cooling, electrical measurement, and more, making it an all-around platform for micro-nano materials research.

ZEM Series Scanning Electron Microscopes

Full Series Coverage, Choose Your Preferred ZEPTOOLS SEM

Product Model	ZEM Ultra	ZEM30 Pro	ZEM30	ZEM20 Pro	ZEM20	ZEM18	ZEM10
Resolution	<2.5nm	2.5nm	3nm	3nm	4nm	<6nm	<10nm
Maximum Magnification	1,000,000x	500,000x	500,000x	500,000x	360,000x	360,000x	250,000x
Electron Gun	Schottky Field Emission	LaB6	Tungsten Filament	LaB6	Tungsten Filament	Tungsten Filament	Tungsten Filament
Accelerating Voltage	1-15kV Continuously Adjustable	3-30kV Continuously Adjustable	3-30kV Continuously Adjustable	3-20kV Continuously Adjustable (Upgradeable to 30kV)	3-20kV Continuously Adjustable (Upgradeable to 30kV)	3-20kV Continuously Adjustable	5kV/10kV/15kV
Detector Type	SE BSE EDS (Optional)	SE BSE EDS (Optional)	SE BSE EDS (Optional)	SE BSE EDS (Optional)	SE BSE EDS (Optional)	SE BSE EDS (Optional)	SE or BSE
In-Situ Expansion Capability	Yes	Yes	Yes	Yes	Yes	Yes	——