Piezo Objective Lens NF100LA

Nanometer-Level Objective Autofocus Scanning Stage
Frictionless Flexure Hinge, Fully Closed-Loop Nanometer Precision

4nm Resolution | 100µm Focusing Travel | Non-Magnetic Material

Piezo Objective Lens NF100LA is a nanometer-level objective scanning stage driven by piezoelectric ceramics. It adopts a frictionless and backlash-free flexure hinge guiding mechanism internally, ensuring excellent motion precision. The scanning stage has a built-in precision displacement sensor for fully closed-loop position feedback, enabling positioning accuracy, resolution, and stability to reach the nanometer level, with positioning settling time of only milliseconds.

The scanning stage is made of non-magnetic material, generating no magnetic field during operation and being immune to magnetic interference. The focusing travel reaches up to 100µm. The split-type thread adapter design allows flexible adaptation to various objective lens models.

Main Technical Specifications

Nanometer Precision with Millisecond Response

Resolution: 4nm

Focusing Travel: 80µm (nominal, 0~100V) / 120µm (maximum, 0~150V)

Repeatability: 10nm, positioning settling time only 13ms

Sensor Type: Optical encoder sensor, fully closed-loop position feedback

Control Mode: Open-loop / Closed-loop selectable

Motion Axis: Z-axis, resonant frequency 150Hz

Operating Temperature: -20℃ to +80℃, non-magnetic material

Product Specifications

Split-Type Thread Adapter, Flexible Adaptation to Multiple Objective Lens Specifications

RMS Interface: W0.8"×1/36" standard objective thread

M25 Interface: M25×0.75mm objective thread

M26 Interface: M26×0.75mm objective thread

M27 Interface: M27×0.75mm objective thread

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Applications

Nanometer Positioning, Empowering Advanced Microscopy Imaging

With nanometer-level resolution and millisecond-level response speed, the Piezo Objective Lens NF100LA is widely used in confocal microscopy, super-resolution microscopy imaging, autofocus systems, fast Z-axis layer scanning, and various scientific research and industrial microscopy scenarios that demand stringent positioning accuracy and dynamic performance.