Product classification
ZEM20 Tungsten Filament Desktop SEM
ZEM20 Tungsten Filament Desktop Scanning Electron Microscope
Classification:
Product Description
Cost-Effective Tungsten Filament
ZEM20
Extra-Large Sample Chamber for Extensive In-Situ Expansion
4nm Resolution | 360,000x Magnification
Compact and Easy to Use, Stable Performance
The Reliable Choice for the Laboratory
The ZEPTOOLS ZEM20 is a cost-effective tungsten filament desktop scanning electron microscope launched by ZEPTOOLS, featuring simple operation and stable performance. It has a compact design and requires no complex installation, making it suitable for rapid imaging in ordinary laboratory environments. The device delivers excellent performance with a resolution of up to 4nm and a maximum magnification of up to 360,000x, capable of clearly presenting the microscopic morphological details of samples. With its exceptional imaging quality and portable characteristics, it can flexibly adapt to diverse application scenarios such as fixed laboratory deployment and on-site temporary inspection, precisely matching the microscopic analysis needs at different levels including university research, corporate R&D, and industrial inspection.
ZEM Series Scanning Electron Microscopes
Full Series Coverage, Choose Your Preferred ZEPTOOLS SEM
| Product Model | ZEM Ultra | ZEM30 Pro | ZEM30 | ZEM20 Pro | ZEM20 | ZEM18 | ZEM10 |
| Resolution | <2.5nm | 2.5nm | 3nm | 3nm | 4nm | <6nm | <10nm |
| Maximum Magnification | 1,000,000x | 500,000x | 500,000x | 500,000x | 360,000x | 360,000x | 250,000x |
| Electron Gun | Schottky Field Emission | LaB6 | Tungsten Filament | LaB6 | Tungsten Filament | Tungsten Filament | Tungsten Filament |
| Accelerating Voltage | 1-15kV Continuously Adjustable | 3-30kV Continuously Adjustable | 3-30kV Continuously Adjustable | 3-20kV Continuously Adjustable (Upgradeable to 30kV) | 3-20kV Continuously Adjustable (Upgradeable to 30kV) | 3-20kV Continuously Adjustable | 5kV/10kV/15kV |
| Detector Type | SE BSE EDS (Optional) | SE BSE EDS (Optional) | SE BSE EDS (Optional) | SE BSE EDS (Optional) | SE BSE EDS (Optional) | SE BSE EDS (Optional) | SE or BSE |
| In-Situ Expansion Capability | Yes | Yes | Yes | Yes | Yes | Yes | —— |
Application Cases
Exceptional Imaging Technology Meets All Your Requirements

More Cases
ZEPTOOLS ZEM Series SEM Helps Research Teams Publish High-Level Journal Achievements
Some Customers
The Trusted Choice of Numerous Universities, Research Institutions, and Enterprises

Start Your High-Resolution Observation Journey
Independently Developed by ZEPTOOLS, Providing a Complete Set of Micro-Nano Analysis Solutions
Recommended Products
Welcome your message consultation




