ZEM18 Tungsten Filament Desktop SEM

ZEM18 Tungsten Filament Desktop SEM

ZEM18 Tungsten Filament Desktop Scanning Electron Microscope

Classification:

Scanning Electron Microscope

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Product Description

Cost-Effective Tungsten Filament

ZEM18

Simple Operation, Rapid Imaging

Better than 6nm Resolution | 360,000x Magnification

Compact and Easy to Use, Stable Performance 
The Reliable Choice for the Laboratory

The ZEPTOOLS ZEM18 is a cost-effective tungsten filament desktop scanning electron microscope. With a high resolution better than 6nm and a maximum magnification of up to 360,000x, it can clearly present the microscopic morphology and fine structures of samples. It features a compact desktop design, equipped with rapid vacuum pumping and smooth imaging technology, offering convenient operation and outstanding efficiency. It is also compatible with various in-situ functional expansions, balancing professional imaging quality with ease of use, making it an efficient preferred device for research and inspection in fields such as materials, semiconductors, and new energy.

ZEM Series Scanning Electron Microscopes

Full Series Coverage, Choose Your Preferred ZEPTOOLS SEM

Product ModelZEM UltraZEM30 ProZEM30ZEM20 ProZEM20ZEM18ZEM10
Resolution<2.5nm2.5nm3nm3nm4nm<6nm<10nm
Maximum Magnification1,000,000x500,000x500,000x500,000x360,000x360,000x250,000x
Electron GunSchottky Field EmissionLaB6Tungsten FilamentLaB6Tungsten FilamentTungsten FilamentTungsten Filament
Accelerating Voltage1-15kV Continuously Adjustable3-30kV Continuously Adjustable3-30kV Continuously Adjustable3-20kV Continuously Adjustable 
(Upgradeable to 30kV)		3-20kV Continuously Adjustable 
(Upgradeable to 30kV)		3-20kV Continuously Adjustable5kV/10kV/15kV
Detector TypeSE 
BSE 
EDS (Optional)		SE 
BSE 
EDS (Optional)		SE 
BSE 
EDS (Optional)		SE 
BSE 
EDS (Optional)		SE 
BSE 
EDS (Optional)		SE 
BSE 
EDS (Optional)		SE or BSE
In-Situ Expansion CapabilityYesYesYesYesYesYes——

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Application Cases

Exceptional Imaging Technology Meets All Your Requirements

More Cases

ZEPTOOLS ZEM Series SEM Helps Research Teams Publish High-Level Journal Achievements

Nature Sub-Journal: Fiber-Integrated Graphene Ultrafast Electron Source

Nature Sub-Journal: Fiber-Integrated Graphene Ultrafast Electron SourceZEPTOOLS ZEM Series Desktop SEM served as the demonstration platform, replacing the original tungsten filament gun with a fiber-integrated graphene ultrafast thermionic electron gun, achieving pure pulsed electron imaging (~100 nm resolution) and CdSe/ZnS quantum dot cathodoluminescence/time-domain spectroscopy measurements, verifying that this light source is plug-and-play on conventional electron microscopes and enables time-resolved characterization.

New Strategy for Bladder Cancer Immunotherapy

New Strategy for Bladder Cancer ImmunotherapyZEPTOOLS ZEM Series Desktop SEM was used for BCG-MBs morphological characterization. After gold sputter coating of lyophilized microbubbles, multi-magnification observation revealed their regular spherical contours and smooth surfaces, and clearly presented the irregular attachment of BCG bacteria on the shell surface, providing direct microscopic evidence for the successful construction of microbubble structures and drug loading distribution.

Aluminum Alloy/PEEK Friction Lap Welding

Aluminum Alloy/PEEK Friction Lap WeldingZEPTOOLS ZEM Series Desktop SEM was used to characterize the cross-section and fracture surface micromorphology of 5052Al/PEEK friction lap welded joints, clearly presenting the interfacial molten layer, spherical bubbles (approximately 500 μm), and the ridge-like PEEK strong bonding zone adjacent to the bubbles, providing direct microscopic evidence for the regulation of bubbles by heat-pressure ratio U and the establishment of interfacial bonding mechanisms.

Ferroelectric Domain Coupling Mechanism of Polycrystalline PZT Ceramics

Ferroelectric Domain Coupling Mechanism of Polycrystalline PZT CeramicsZEPTOOLS ZEM Series SEM was used to observe the fracture surface morphology of 75/25PZT and Mn/Nb-doped samples before and after quenching, statistically analyzing the average grain size (approximately 1.8–5.1 μm and essentially unchanged after quenching), corroborating that the changes in electrical properties originate from domain structure rather than grain size or grain boundaries.

Powerful Tool for Triple Barrier Structure Morphology Characterization

Powerful Tool for Triple Barrier Structure Morphology CharacterizationZEPTOOLS ZEM Series Desktop SEM was used to observe the micromorphology of cellulose/chitosan coaxial cryogel fibers (CCF): clearly presenting the triple barrier structure of the regenerated cellulose sheath layer (~1 μm pores), the retained air layer between sheath and core (approximately 200 μm), and the chitosan core layer (<500 nm nanopores), providing direct morphological evidence for the thermal insulation mechanism.

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Independently Developed by ZEPTOOLS, Providing a Complete Set of Micro-Nano Analysis Solutions

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Email Consultation micage@zeptools.com

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