In-Situ 3D Tomography Sample Holder

PicoFemto In-Situ 3D Tomography Sample Holder

Self-Rotation of the Sample Holder 
Reconstructing 3D Microstructures

360° Self-Rotation | Independent of the TEM Goniometer | Synchronized Multi-Angle Acquisition | 3D Structure Reconstruction

The In-Situ 3D Tomography Sample Holder is a precision in situ tem holder designed for advanced TEM observation and 3D tomography research. Compatible with Thermo Fisher, JEOL, Hitachi, and other compatible systems, it supports 360° α rotation without being limited by the TEM goniometer. With α rotation resolution better than ±0.1°, 0.2 nm resolution, and drift of ≤1.5 nm/min, it helps researchers achieve controlled sample positioning and stable image acquisition from multiple viewing angles.

Designed for practical laboratory use, the holder combines precise movement with a complete configuration including the sample holder, holder base, sample stage, carrying case, and tool accessories. Careful machining, dimensional inspection, alignment, assembly, and functional testing help maintain reliable mechanical performance throughout use. Whether studying advanced materials, nanostructures, or complex specimen morphology, this solution provides greater flexibility for tomography workflows. Contact the supplier to learn more about compatibility, configuration, and application support.

ZEPTOOLS PicoFemto In-Situ 3D Tomography Sample Holder is a high-end in-situ characterization accessory compatible with mainstream TEM, specifically designed for precise 3D characterization of material microstructures. The sample holder can autonomously perform full-range rotation without relying on the TEM goniometer, enabling dead-angle-free observation of samples and synchronized acquisition of high-resolution images at different angles. This helps researchers construct 3D models of sample microstructures, breaking the limitations of traditional 2D imaging and limited-angle observation. The product features a stable structure and reliable operation, effectively ensuring imaging clarity and data reliability during rotation. It can be optionally equipped with various types of sample stages according to experimental needs, flexibly adapting to samples of different specifications and types. It is widely used in cutting-edge fields such as materials science, semiconductors, and nanodevices, providing efficient and reliable experimental support for revealing the spatial distribution patterns of microstructures and tackling the challenges of 3D structure characterization.

Main Technical Specifications

Autonomous rotation for multi-angle image acquisition, compatible with mainstream models, ready to use out of the box

Compatibility 
Thermo Fisher, JEOL, Hitachi, etc.

α Rotation Mode 
360° self-rotation of the sample holder, not limited by the TEM goniometer

α Rotation Resolution 
Better than ±0.1°

Resolution 
0.2 nm

Drift 
≤ 1.5 nm/min

Main Configuration 
Sample holder, sample holder base, carrying case, sample stage, tool accessories, etc.

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