PicoFemto In-Situ Probe Sample Holder Series

Multi-field In-Situ, Precise Manipulation
Fully Compatible with Mainstream TEM

ZEPTOOLS PicoFemto In-Situ Probe Sample Holder Series covers single-tilt, double-tilt, opto-electrical, mechano-electrical, cryogenic, vacuum transfer and other types, and is fully compatible with mainstream TEM, meeting the diverse needs of different scientific research scenarios. This series of sample holders is centered on an integrated design, deeply integrating probe manipulation with multi-field in-situ testing functions. It enables precise sample positioning and manipulation without complex debugging, and is paired with a convenient software control system, greatly lowering the operational threshold while balancing professionalism and ease of use.

The product features outstanding core advantages and flexible adaptability, seamlessly connecting to various mainstream TEM equipment without additional modification. It integrates multiple in-situ testing functions, enabling sample characterization and performance measurement under a multi-field coupling environment, breaking the limitations of traditional offline testing and helping researchers capture the dynamic evolution process and transient characteristics of materials. At the same time, the complete set of equipment is fully equipped and easy to deploy, with comprehensive auxiliary tools and data processing functions, efficiently supporting cutting-edge scientific research. It is a core auxiliary device for conducting high-end in-situ research and tackling scientific challenges in fields such as materials, semiconductors, and new energy.

Single-Tilt / Double-Tilt Probe Holder

Compatible with mainstream TEM, enabling precise probe manipulation and highly sensitive electrical measurement. The double-tilt model supports multi-angle observation, meeting different in-situ electrical characterization needs.

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Single-Tilt / Double-Tilt Opto-Electrical Probe Holder

Integrates optical and electrical dual-function modules, enabling simultaneous photoexcitation and electrical testing within the TEM. The double-tilt version offers more flexible observation, suitable for in-situ research on optoelectronic devices.

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Single-Tilt Mechano-Electrical Probe Holder (AFM)

Enables simultaneous quantitative nanomechanical measurement and highly sensitive electrical characterization, providing a precise and reliable in-situ experimental platform for studying mechano-electrical coupling properties of materials.

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Single-Tilt / Double-Tilt Mechano-Thermo-Electrical Probe Holder (Non-Quantitative Force)

Integrates mechanical, thermal, and electrical multi-field loading, supporting in-situ tensile, compressive, and electrical testing at high temperatures. The double-tilt model enables more comprehensive microstructure observation.

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Single-Tilt Mechano + Thermo + Optical + Electrical Probe Holder (Non-Quantitative Force, Multi-Field)

Integrates mechanical, thermal, optical, and electrical functions into one unit, enabling in-situ dynamic characterization under multi-field coupling environments within the TEM, meeting complex cutting-edge research needs.

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Cryogenic Probe Holder

Supports in-situ probe manipulation and electrical measurement under ultra-low temperature environments, providing stable and reliable experimental conditions for research in low-temperature physics, low-dimensional materials, and more.

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In-Situ Quantitative Mechano-Thermal Sample Holder

Enables high-precision quantitative mechanical loading and mechano-thermal coupling testing at high temperatures, suitable for studying mechanical and thermal properties of materials under harsh conditions.

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Single-Tilt / Double-Tilt Vacuum Transfer Probe Holder

Enables vacuum-sealed transfer of samples between a glovebox and the TEM, effectively protecting air-sensitive samples and ensuring authentic and reliable in-situ experimental results.