Manual Room-Temperature Probe Station

Manual Room-Temperature Probe Station

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Product Description

Probe Station Series

Manual Room-Temperature Probe Station

Manual coarse and fine adjustment, saving testing time 
A highly reliable room-temperature precision testing platform

Manual operation | 4 probe arms as standard | Up to 6 inches

The Manual Room-Temperature Probe Station is a highly reliable probe station system independently developed by ZEPTOOLS. It is mainly used in scientific research fields such as semiconductors/microelectronics, electronics, electromechanics, physics, chemistry, materials, optoelectronics, nanotechnology, MEMS, biochips, and aerospace, as well as in IC design/manufacturing/testing/packaging and other fields. The stage is equipped with vacuum suction holes that use negative pressure to hold the sample, minimizing damage to the sample.

The system adopts a positioning method combining manual coarse and fine adjustment, allowing flexible changes in test dimensions and significantly saving testing time. The modular design supports replacement of key components, with a simple structure and convenient operation. The combination of a non-magnetic vacuum suction sample stage and ultra-low leakage probe design provides stable and reliable contact and signal quality for device electrical measurements.

Main Technical Specifications

Manual fine adjustment, stable and reliable room-temperature measurement

Measurable wafer: up to 6 inches

Probe arms: 4 as standard, up to 6 can be installed

Movement resolution: 0.001mm

Wafer fixing method: wafer vacuum suction

Probe holder: magnetic suction base

Leakage accuracy: better than 300fA

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Trusted by numerous universities, research institutions, and enterprises

Selected Customers

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Independently developed by ZEPTOOLS, built for high-end applications

Call Us +86-400-966-2800

Email Us micage@zeptools.com

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