Product classification
Manual Room-Temperature Probe Station
Manual Room-Temperature Probe Station
Classification:
Product Description
Probe Station Series
Manual Room-Temperature Probe Station
Manual coarse and fine adjustment, saving testing time
A highly reliable room-temperature precision testing platform
Manual operation | 4 probe arms as standard | Up to 6 inches
The Manual Room-Temperature Probe Station is a highly reliable probe station system independently developed by ZEPTOOLS. It is mainly used in scientific research fields such as semiconductors/microelectronics, electronics, electromechanics, physics, chemistry, materials, optoelectronics, nanotechnology, MEMS, biochips, and aerospace, as well as in IC design/manufacturing/testing/packaging and other fields. The stage is equipped with vacuum suction holes that use negative pressure to hold the sample, minimizing damage to the sample.
The system adopts a positioning method combining manual coarse and fine adjustment, allowing flexible changes in test dimensions and significantly saving testing time. The modular design supports replacement of key components, with a simple structure and convenient operation. The combination of a non-magnetic vacuum suction sample stage and ultra-low leakage probe design provides stable and reliable contact and signal quality for device electrical measurements.
Main Technical Specifications
Manual fine adjustment, stable and reliable room-temperature measurement
Measurable wafer: up to 6 inches
Probe arms: 4 as standard, up to 6 can be installed
Movement resolution: 0.001mm
Wafer fixing method: wafer vacuum suction
Probe holder: magnetic suction base
Leakage accuracy: better than 300fA
Selected Customers
Trusted by numerous universities, research institutions, and enterprises

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Independently developed by ZEPTOOLS, built for high-end applications
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