PicoFemto Nanoprobe Station for SEM

Precise positioning in three-dimensional space, high-vacuum compatible
A powerful tool for micro/nano manipulation and in-situ measurement

Nano manipulation | In-situ measurement | High-vacuum compatible | Optional multi-probe configuration

ZEPTOOLS PicoFemto Nanoprobe Station for SEM achieves precise positioning in three-dimensional space. It features small size, large travel range, high precision, and ease of operation, while also being high-vacuum compatible. It is an important in-situ functional accessory for scanning electron microscopes. Multiple three-axis probe stations can be installed in a single SEM chamber. The platform can be equipped with various manipulation and measurement heads such as electrical probes, fiber-optic probes, nano tweezers, diamond nano-mechanical indenters, and microinjectors, enabling micro/nano manipulation and measurement.

The standard configuration includes the probe body, a base compatible with SEM/FIB, a vacuum feedthrough flange, a probe controller, and a control handle. Optional items include low-temperature and high-temperature sample stages, fiber-optic chucks and fiber-optic vacuum feedthroughs, EBIC kits, and more, allowing flexible expansion of various experimental capabilities.

Product Features

Compact and rigid, high-precision flexure guidance

Compact structure with high rigidity

Zero-clearance, high-precision flexure hinge guidance system

Piezoelectric ceramic displacement stage with ultra-long service life

Position feedback can be added internally as required

Wide range of applications: nanomaterial manipulation, electrical/optical and other physical property measurements of nanodevices, biological cell and DNA manipulation, etc.

Compatible with SEM: JEOL, Hitachi, FEI, TESCAN, etc.